Emission microscopy (EMMI) is an efficient optical analysis technique used to detect and localize certain integrated circuit (IC) failures.
The Visionary is a computer controlled modular test station with many additional exclusive features that facilitate operation and maintenance, improve sensitivity, enhance reliablity, and extend the range of applications beyond that obtainable with less capable emission microscopes.
The Visionary can detect up to 95 percent of all IC defects. This makes it the tool of choice for failure analysis, process development, product engineering, and reliablity testing.
Typical Application
Junction Defects
Junction Walkouts
ESD Breakdown
Dielectric Defects
Process induced dielectric damage
Dielectric Process Development
CMOS Latch-up
Junction Spiking
Bipolar/BiCMOS circuitry
Metal Stringer
Evaporation
High-current resistive shorts
Current Flow Paths in FET's
Stand-by/Leakage current in CMOS devices
Floating Nodes
HyperLens: Along working distance, large numerical aperture, wide-angle lens for analysis of large devices under test ("DUTs") with extremely sensitivity.
User Interface: The Windows based microscope software is simple to learn and use yest is extremely powerful, with many advanced features. Minimal training and maintenance are required.
Clipboard Support: Images can be copied to the clipboard from within the Visionary software. This greatly facilitates the creation of papers, reports and presentations by allowing the user to place the images into any application that support the clipboard.
BMP and TIF support: Any image can be saved to disk as a BMP or TIF file. Enabling access of information for other parties via networks.
Configuration Utilities: The use of seperate Windows based configuration utilities allow for easy, interactive software reconfiguration by a qualified System Custodian, without the possibility of accidental modification of the hardware configuration file by day to day users.
Diagnostic Utility: The Diagnostic utility is another Windows applications that allows for manual control of every harware function as well as displaying the staus of all system interlocks, greatly facilitating system set-up and hardware debugging.
'Live mode' failure analysis: Enabling real-time observation of dynamic events such as latch-up spreading, thermal runaway, and junction/oxide/MOSFET stress. Up to 16 'time slices' can be stored on a FIFO basis. These images can be separated by as little as a thirtieth of a second. There is no upper bound for the maximum time between images.
Advanced image processing: Images can easily be enhanced to optimize clarity and emission sensitivity.
Dynamic image acquisition: Image acquisition is under continuous user control and can be interrupted at any time to optimise productivity.
Liquid crystal set-up: The instrument is instantly adaptable for liquid-crystal analysis of low-resistance ohmic shorts.
Interlocked Image Intensifier: The sensor is protected against excessive illumination at all times, thereby retaining its maximum sensitivity and extending its life.
Access to enclosure interior: The light-tight enclosure enable easy user access to the probe station and microscope.
Motorised microscope: Micorscope head motion is motorised to enable positioning and focusing with the enclosure doors closed.
