STOCK REF#: C205
Cambridge Stereoscan 600 Scanning Electron Microscope SEM
The over- all range of magnification is from 20 times to 50000 times.
Simple to accommodate, to operate, to maintain. Yet not so simple that it cannot provide you with most of the facilities of a full research-grade SEM at less than half the cost.
Easy installation; no special environment; minimal operator training; can achieve 100 8, resolution; 25kV variable beam voltage; transmission facility; microanalysis capability.
Comes from a working laboratory, complete with installation and operating manuals, PC and Software.
The Stereoscan 600 displays information derived from the action of an electron probe scanning the surface of a specimen; the displayed image-has a three- dimensional appearance. The microtopography of solid bulk specimens con be examined as can surfaces whose roughness or other characteristics render their observation extremely difficult or impossible by means of a conventional transmission electron microscope, using either direct or extraction replica methods. The specimen detail resolution is always better than l5nm under satisfactory conditions, with a depth of focus that is at least 300 times greater than that of a light microscope at the limit of resolution, when both types of microscope are adjusted for optimum performance. The Stereoscan has a switched-magnification range between x20 and x50,000 on this Scanning electron microscope, which represents a scanned area on the specimen from 6mm x 5mm to 2.4pm x 21Jm at 10mm working distance. The true magnification at all working distances is indicated by a 1i-mark on the display, and can be as low as x8 at 40mm working distance, or as high as x80, 000 at 2mm working distance.
X-Ray Analysis Module
Serial No. 180-1281
DET AREA 10mm
Resolution at 5.9keV is 149eV
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